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A Quantitative Method for In-Situ Pump-Beam Metrology in Ultrafast Electron Microscopy
Published online by Cambridge University Press: 30 July 2021
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- Type
- Fast and Ultrafast Dynamics Using Electron Microscopy
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- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
This work was supported partially by the American Chemical Society Petroleum Research Fund and partially by the U.S. Department of Energy through the UMN Center for Quantum Materials under Grant No. DE-SC-0016371.Google Scholar
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