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Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs

Published online by Cambridge University Press:  30 July 2020

Steven Spurgeon ,
Bethany Matthews ,
Peter Sushko ,
Xiayu Linpeng ,
Maria Viitaniemi ,
Mikhail Durnev ,
Mikhail Glazov ,
Andreas Wieck ,
Arne Ludwig  and
Kai-Mei Fu
Steven Spurgeon
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Bethany Matthews
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Peter Sushko
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Xiayu Linpeng
Affiliation:
University of Washington, Seattle, Washington, United States
Maria Viitaniemi
Affiliation:
University of Washington, Seattle, Washington, United States
Mikhail Durnev
Affiliation:
Ioffe Institute, St. Petersburg, Saint Petersburg City, Russia
Mikhail Glazov
Affiliation:
Ioffe Institute, St. Petersburg, Saint Petersburg City, Russia
Andreas Wieck
Affiliation:
Ruhr-Universität Bochum, Bochum, Bremen, Germany
Arne Ludwig
Affiliation:
Ruhr-Universität Bochum, Bochum, Bremen, Germany
Kai-Mei Fu
Affiliation:
University of Washington, Seattle, Washington, United States

Abstract

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Type
Advances in Microscopy for Quantum Information Sciences
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2822 - 2823
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Copyright
Copyright © Microscopy Society of America 2020

References

Durnev, et al. Phys. Rev. B. 2020, 101.12: 125420.10.1103/PhysRevB.101.125420CrossRefGoogle Scholar
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Pryor, A. et al. i Adv. Struct. Chem. Imaging 2017, 3 (1), 15.10.1186/s40679-017-0048-zCrossRefGoogle Scholar