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Rapid Observation with an Atmospheric Scanning Electron Microscope

Published online by Cambridge University Press:  08 April 2017

H Nishiyama ,
M Suga ,
M Koizumi ,
K Ogawa ,
Y Konyuuba ,
D Guarrera  and
C Sato
H Nishiyama
Affiliation:
JEOL Ltd
M Suga
Affiliation:
JEOL Ltd
M Koizumi
Affiliation:
JEOL Ltd
K Ogawa
Affiliation:
JEOL Technics Ltd
Y Konyuuba
Affiliation:
JEOL Ltd
D Guarrera
Affiliation:
JEOL USA Inc
C Sato
Affiliation:
National Institute of Industrial Science and Technology, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 510 - 511
Copyright
Copyright © Microscopy Society of America 2011