Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-20T06:30:34.602Z Has data issue: false hasContentIssue false
  • English
  • Français

Real-time Analysis of Oxygen Vacancy of Indium Oxide via Environmental Transmission Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

Chenyue Qiu ,
Mengsha Li ,
Stas Dogel ,
Hooman Hosseinkhannazer ,
Lu Wang ,
Doug Perovic  and
Jane Howe
Chenyue Qiu*
Affiliation:
Department of Materials Science and Engineering, University of Toronto, Toronto, ON., Canada
Mengsha Li
Affiliation:
Department of Materials Science and Engineering, University of Toronto, Toronto, ON., Canada
Stas Dogel
Affiliation:
Hitachi High-Tech Canada Inc., Etobicoke, ON., Canada
Hooman Hosseinkhannazer
Affiliation:
Norcada Inc., Edmonton, AB., Canada
Lu Wang
Affiliation:
School of Science and Engineering, The Chinese University of Hong Kong (Shenzhen), Guangdong, China
Doug Perovic
Affiliation:
Department of Materials Science and Engineering, University of Toronto, Toronto, ON., Canada
Jane Howe
Affiliation:
Department of Materials Science and Engineering, University of Toronto, Toronto, ON., Canada Department of Chemical Engineering and Applied Chemistry, University of Toronto, Toronto, ON., Canada
*
*Corresponding author: chenyue.qiu@mail.utoronto.ca

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
In Situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1868 - 1870
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Zhang, X. et al. , Nat. Catal. 3, (2020), p. 411. doi.org/10.1038/s41929-020-0440-2CrossRefGoogle Scholar
Yoshita, H. et al. , Science 321, (2008), p. 317. doi.org/10.1126/science.1213194Google Scholar
Nolte, P. et al. , Science 321, (2008), p. 1654. doi.org/10.1126/science.1160845CrossRefGoogle Scholar
Sato, S. & Kadowaki, T., J. Catal. 106, (1987), p. 295.10.1016/0021-9517(87)90235-1CrossRefGoogle Scholar
Wang, L. et al. , Nat. Commun. 11, (2020), p. 2432. doi.org/10.1038/s41467-020-16336-zCrossRefGoogle Scholar
Howe, J. Y. et al. , Microsc. Microanal. 23, (2017), p. 66.10.1017/S1431927617001015CrossRefGoogle Scholar
Torruella, P. et al. , J. Phys. Chem. C. 121, (2017), p. 24809. doi.org/10.1021/acs.jpcc.7b06310CrossRefGoogle Scholar
The authors acknowledge the funding source from the Natural Sciences and Engineering Research Council (NSERC) of Canada, and the use of the electron microscopy facility at the Open Centre for the Characterization of Advanced Materials (OCCAM).Google Scholar