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Reliable Quantification of EELS Spectra with a Simple Model–Based Approach

Published online by Cambridge University Press:  26 July 2009

G Duscher
Affiliation:
University of Tennessee,Knoxville
ME Hmielewski
Affiliation:
University of Tennessee,Knoxville
JDO Oduor
Affiliation:
University of Tennessee,Knoxville

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2009