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Removal of FIB Damage using Flash Electropolishing for Artifact-free TEM Foils

Published online by Cambridge University Press:  05 August 2019

Alan Schemer-Kohrn ,
Mychailo B. Toloczko ,
Yuanyuan Zhu ,
Jing Wang  and
Danny J. Edwards
Alan Schemer-Kohrn*
Affiliation:
Reactor Materials and Mechanical Design Group, Nuclear Sciences Division, Pacific Northwest National Laboratory, Richland, WA 99352, USA
Mychailo B. Toloczko
Affiliation:
Reactor Materials and Mechanical Design Group, Nuclear Sciences Division, Pacific Northwest National Laboratory, Richland, WA 99352, USA
Yuanyuan Zhu
Affiliation:
Reactor Materials and Mechanical Design Group, Nuclear Sciences Division, Pacific Northwest National Laboratory, Richland, WA 99352, USA Department of Materials Science and Engineering, Institute of Materials Science, University of Connecticut, Storrs, CT 06269, USA
Jing Wang
Affiliation:
Reactor Materials and Mechanical Design Group, Nuclear Sciences Division, Pacific Northwest National Laboratory, Richland, WA 99352, USA
Danny J. Edwards
Affiliation:
Reactor Materials and Mechanical Design Group, Nuclear Sciences Division, Pacific Northwest National Laboratory, Richland, WA 99352, USA
*
*Corresponding author: alan.schemerkohrn@pnnl.gov

Abstract

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Type
Microscopy and Microanalysis of Nuclear and Irradiated Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1606 - 1607
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Aitkaliyeva, A, Madden, JW, Miller, BD, Cole, JI, Journal of Nuclear Materials 459 (2015) 241-246.Google Scholar
[2]Presley, M., Ph.D Dissertation, Ohio State University (2016).Google Scholar
[3]Huang, Y, Zhang, H, Auger, M.A., Hong, Z., Ning, H., Gorley, M.J., Grant, P.S., Reece, M.J., Yan, H., Journal of Nuclear Materials 487 (2017) 433-442.Google Scholar
[4]The authors acknowledge funding from the U.S. Department of Energy Office of Nuclear Energy's Nuclear Energy Enabling Technologies program project CFA 16-10570.Google Scholar