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Resolution Investigation of Potentiometric-Scanning Ion Conductance Microscopy

Published online by Cambridge University Press:  09 October 2013

A. Weber
Affiliation:
C.-C. Chen
Affiliation:
Y. Zhou
Affiliation:
L.A. Baker
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2013