Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-09T03:35:37.598Z Has data issue: false hasContentIssue false
  • English
  • Français

Resolving Internal Magnetic Structures of Skyrmions by Lorentz Electron Ptychography

Published online by Cambridge University Press:  05 August 2019

Zhen Chen ,
Emrah Turgut ,
Yi Jiang ,
Kayla X. Nguyen ,
Gabriela C. Correa ,
Matthew J. Stolt ,
Song Jin ,
Daniel C. Ralph ,
Gregory D. Fuchs  and
David A. Muller
Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA.
Emrah Turgut
Affiliation:
Department of Physics, Oklahoma State University, Stillwater, OK 74078, USA.
Yi Jiang
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.
Kayla X. Nguyen
Affiliation:
Department of Chemistry and Chemical Biology, Cornell University, Ithaca, NY 14853, USA.
Gabriela C. Correa
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853, USA.
Matthew J. Stolt
Affiliation:
Department of Chemistry, University of Wisconsin–Madison, Madison, WI 53706, USA.
Song Jin
Affiliation:
Department of Chemistry, University of Wisconsin–Madison, Madison, WI 53706, USA.
Daniel C. Ralph
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853, USA.
Gregory D. Fuchs
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA.
David A. Muller*
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA. Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY 14853, USA.
*
*Corresponding author: david.a.muller@cornell.edu

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 32 - 33
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Wiesendanger, R, Rev. Mod. Phys. 81 (2009), p. 1495.Google Scholar
[2]Chapman, J et al. , Ultramicroscopy 3 (1978), p. 203.Google Scholar
[3]Tate, MW et al. , Microsc. Microanal. 22 (2016), p. 237.Google Scholar
[4]Thibault, P and Menzel, A, Nature 494 (2013), p. 68.Google Scholar
[5]Research supported by DARPA (D18AC00009) & NSF (DMR-1539918, DMR-1719875).Google Scholar