Hostname: page-component-848d4c4894-8kt4b Total loading time: 0 Render date: 2024-07-06T23:15:54.575Z Has data issue: false hasContentIssue false
  • English
  • Français

Revisiting EELS Fine Structure Analysis for Polymers

Published online by Cambridge University Press:  30 July 2020

Robert Colby ,
Robert Williams ,
Donald Carpenter ,
Nuria Bagues ,
David McComb  and
Srinivasan Rajagopalan
Robert Colby
Affiliation:
ExxonMobil Research and Engineering Company, Annandale, New Jersey, United States
Robert Williams
Affiliation:
The Ohio State University, Hilliard, Ohio, United States
Donald Carpenter
Affiliation:
ExxonMobil Research and Engineering Company, Annandale, New Jersey, United States
Nuria Bagues
Affiliation:
The Ohio State University, Columbus, Ohio, United States
David McComb
Affiliation:
Center for Electron Microscopy and Analysis/ Department of Material Science and Engineering, The Ohio State University, Columbus, Ohio, United States
Srinivasan Rajagopalan
Affiliation:
ExxonMobil Research and Engineering Company, Annandale, New Jersey, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 474 - 476
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Transmission Electron Energy Loss Spectrometry in Materials Science and The EELS Atlas, 2004, Chapter 12, pages 419–454.10.1002/3527605495.ch12CrossRefGoogle Scholar
Microscopy, 62, 1, 2013, pages 3–21.10.1093/jmicro/dfs089CrossRefGoogle Scholar
J. Phys.: Conf. Ser. 522, 2014, page 012023.Google Scholar
Microscopy, 67, Supplement 1, 2018, pages i86–i97.10.1093/jmicro/dfx088CrossRefGoogle Scholar
Sci. Rep. 7, 2017, 8243.10.1038/s41598-017-07709-4CrossRefGoogle Scholar
J. Phys. Chem. B, 113, 7, 2009, pages 1869–1876.Google Scholar