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RF Photoinjector Based Time-Resolved MeV Electron Microscopy

Published online by Cambridge University Press:  23 September 2015

P. Musumeci

Abstract

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Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 653 - 654
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Batson, P. E, Dellby, N & Krivanek, O. L., Nature 418, 617 (2002).Google Scholar
[2] Future Science Needs And Opportunities For Electron Scattering: Next-Generation Instrumentation And Beyond, DOE workshop March 1-2 2007.Google Scholar
[3] Dynamic Processes in Biology, Chemistry, and Materials Science: Opportunities for Ultrafast Transmission Electron Microscopy, PNNL workshop June 14-15, 2011.Google Scholar
[4] King, W. E., et al, J. Appl. Phys 97, 111101 (2005).Google Scholar
[5] Zewail, A. H., Science 328, 187 (2010).Google Scholar
[6] Bostanjoglo, O., Advances in Imaging and Electron Physics 121, 1 (2002)..Google Scholar
[7] Browning, N. D, et al., , in Handbook of Nanoscopy, (Chapter 9 2012.Google Scholar
[8] Future of Electron Scattering and Diffraction workshop http://www.orau.gov/electron2014/<underline> </underline>.+.>Google Scholar
[9] Li, R. K. & Musumeci, P., Phys. Rev. Applied 2, 024003 (2014.Google Scholar
[10] Musumeci, P & Li, R. K ICFA Beam Dynamics Newsletter #59 2012.Google Scholar
[11] Li, R. K., et al., Phys. Rev. ST Accel. Beams 15, 090702 (2012).Google Scholar