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The role of Nanocartography in the Development of Automated TEM

Published online by Cambridge University Press:  30 July 2021

Matthew Olszta ,
Kevin Fiedler ,
Steven Spurgeon ,
Sarah Reehl  and
Derek Hopkins
Matthew Olszta
Affiliation:
Pacific Northwest National Laboratory, Washington, United States
Kevin Fiedler
Affiliation:
United States
Steven Spurgeon
Affiliation:
Pacific Northwest National Laboratory, United States
Sarah Reehl
Affiliation:
Pacific Northwest National Laboratory, United States
Derek Hopkins
Affiliation:
Pacific Northwest National Laboratory, United States

Abstract

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Type
Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2986 - 2987
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Olszta, M. and Fiedler, K., Nanocartography in the Age of Automated TEM. Microscopy and Microanalysis, 2020. 26(S2): p. 32-32.CrossRefGoogle Scholar
Cautaerts, N., Delville, R., and Schryvers, D., ALPHABETA: a dedicated open-source tool for calculating TEM stage tilt angles. Journal of Microscopy, 2018. 273.Google ScholarPubMed
Duden, T., et al. , K-space Navigation for Accurate High-angle Tilting and Control of the TEAM Sample Stage. Microscopy and Microanalysis, 2009. 15(S2): p. 1228-1229.CrossRefGoogle Scholar
Li, X.-Z., SPICA: stereographic projection for interactive crystallographic analysis. Journal of Applied Crystallography, 2016. 49(5): p. 1818-1826.CrossRefGoogle Scholar
Liu, Q., A simple and rapid method for determining orientations and misorientations of crystalline specimens in TEM. Ultramicroscopy, 1995. 60(1): p. 81-89.CrossRefGoogle Scholar
Xie, R.-X. and Zhang, W.-Z., [tau]ompas: a free and integrated tool for online crystallographic analysis in transmission electron microscopy. Journal of Applied Crystallography, 2020. 53(2).Google Scholar