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Scale-Bridging 3D-Analysis of Colloidal Clusters Using 360° Electron Tomography and X-Ray Nano-CT

Published online by Cambridge University Press:  05 August 2019

Silvan Englisch*
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University Erlangen-Nürnberg, Germany.
Janis Wirth
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University Erlangen-Nürnberg, Germany.
Thomas Przybilla
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University Erlangen-Nürnberg, Germany.
Benjamin Apeleo Zubiri
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University Erlangen-Nürnberg, Germany.
Junwei Wang
Affiliation:
Institute of Particle Technology at the Department for Chemical and Biological Engineering at the Friedrich-Alexander University Erlangen-Nürnberg, Germany.
Nicolas Vogel
Affiliation:
Institute of Particle Technology at the Department for Chemical and Biological Engineering at the Friedrich-Alexander University Erlangen-Nürnberg, Germany.
Erdmann Spiecker*
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University Erlangen-Nürnberg, Germany.

Abstract

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Type
Leveraging 3D Imaging and Analysis Methods for New Opportunities in Material Science
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Wang, J et al. , Nature Communications 9 (2018), p. 5259.Google Scholar
[2]Przybilla, T et al. , Small Methods 2 (2018), p. 1700276.Google Scholar
[3]The authors thank the DFG for financial support within the frameworks of the research training group GRK1896 ‘In situ Microscopy with Electrons, X-rays and Scanning Probes’ and the project SP648/8 ‘High-resolution X-ray microscopy for correlative tomography, high throughput screening and in situ mechanical testing of structural and functional materials’Google Scholar