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Scanned Probe-Based Chemical and Thermomechanical Property Mapping of Polymeric Materials Suitable for Electronic Applications

Published online by Cambridge University Press:  08 April 2017

L Germinario
Affiliation:
Appalachian State University
K Kjoller
Affiliation:
Anasys Instruments
C Prater
Affiliation:
Anasys Instruments
K Sahagian
Affiliation:
Anasys Instruments

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2011