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Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

Published online by Cambridge University Press:  09 October 2013

H. Xing ,
K. Kim ,
J.M. Zuo ,
M.A. Hemphill ,
G.Y. Wang ,
C.W. Tsai ,
J.W. Yeh ,
K.A. Dahmen  and
P.K. Liaw
H. Xing
Affiliation:
K. Kim
Affiliation:
J.M. Zuo
Affiliation:
M.A. Hemphill
Affiliation:
G.Y. Wang
Affiliation:
C.W. Tsai
Affiliation:
J.W. Yeh
Affiliation:
K.A. Dahmen
Affiliation:
P.K. Liaw
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 720 - 721
Copyright
Copyright © Microscopy Society of America 2013