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Scanning Probe Microscopy in TEM : an In-situ Approach for Nano-scale Property Measurements

Published online by Cambridge University Press:  01 November 2002

Zhong Lin (ZL) Wang
Zhong Lin (ZL) Wang*
Affiliation:
Center for Nanoscience and Nanotechnology, and School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245, e-mail: zhong.wang@mse.gatech.edu

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 300 - 301
Copyright
Copyright © Microscopy Society of America 2002