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Scanning Transmission Helium Ion Microscopy- How Does It Compare to TEM?
Published online by Cambridge University Press: 22 July 2022
Abstract
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- Type
- Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
- Information
- Copyright
- Copyright © Microscopy Society of America 2022
References
Allen, FI, Beilstein J Nanotechnol. 12 (2021), p. 633. doi: 10.3762/bjnano.12.52. PMID: 34285866; PMCID: PMC8261528.CrossRefGoogle Scholar
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Emmrich, D et al. , Beilstein J Nanotechnol. 12 (2021) p. 222. doi: 10.3762/bjnano.12.18. PMID: 33728240; PMCID: PMC7934706.CrossRefGoogle Scholar
Dr. Crystal Cooper is thanked for the many useful discussions and the sample preparation suggestions.Google Scholar