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The SECOM Platform: an Integrated CLEM Solution

Published online by Cambridge University Press:  27 August 2014

S.V. den Hoedt ,
A.P.J. Effting  and
M.T. Haring
S.V. den Hoedt
Affiliation:
DELMIC BV, Delft, The Netherlands
A.P.J. Effting
Affiliation:
DELMIC BV, Delft, The Netherlands
M.T. Haring
Affiliation:
DELMIC BV, Delft, The Netherlands

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1006 - 1007
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Zonnevylle, A.C., et al., Integration of a high-NA light microscope in a scanning electron microscope, Journal of Microscopy, 252, 58-70 (2013).Google Scholar
[2] Liv, N., et al., Simultaneous Correlative Scanning Electron and High-NA Fluorescence Microscopy, Plos One, 8(2), e55707 (2013).Google Scholar