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Secondary Electron Imaging in the Helium Ion Microscope
Published online by Cambridge University Press: 27 August 2014
Abstract
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- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1100 - 1101
- Copyright
- Copyright © Microscopy Society of America 2014
References
[1] The authors thank Dr. John Notte of Zeiss, and Dr. Adam Rondinone of the Center for NanoPhase Materials Science at Oak Ridge National Laboratory, for helpful discussions.Google Scholar