Hostname: page-component-77c89778f8-n9wrp Total loading time: 0 Render date: 2024-07-18T11:45:26.995Z Has data issue: false hasContentIssue false
  • English
  • Français

Semi-Inverted Sample Preparation of Meteorites for High Resolution Analytical Electron Microscopy Using Correlative Raman Spectroscopy and Xe Plasma FIB

Published online by Cambridge University Press:  05 August 2019

Suzy Vitale ,
Andrew Steele ,
Liane G. Benning  and
Richard Wirth
Suzy Vitale*
Affiliation:
Carnegie Institution for Science, Geophysical Laboratory, Washington, DC, USA.
Andrew Steele
Affiliation:
Carnegie Institution for Science, Geophysical Laboratory, Washington, DC, USA.
Liane G. Benning
Affiliation:
German Research Center for Geosciences, GFZ, PotsdamGermany.
Richard Wirth
Affiliation:
German Research Center for Geosciences, GFZ, PotsdamGermany.
*
*Corresponding author: svitale@carnegiescience.edu

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 894 - 895
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Young, R and Moore, M in “Introduction to Focused Ion Beams”, (Springer, New York) p. 249-268.Google Scholar
[2]Giannuzzi, LA et al. in “Introduction to Focused Ion Beams”, (Springer, New York) p. 201-228.Google Scholar
[3]Steele, A et al. , Science Advances 4 (2018).Google Scholar
[4]Steele, A et al. , Science 337 (2012), pp. 212-215.Google Scholar
[5]Kamino, T et al. in “Introduction to Focused Ion Beams”, (Springer, New York) p. 229-246.Google Scholar