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The Significance of Refractive Index “K”¨ Values of 45 to 200 Å 2d LSMs, or, Why Your Long Wavelength Peak Markers May Not Line Up Correctly

Published online by Cambridge University Press:  31 July 2006

J Fournelle ,
K Bolger ,
J Cook ,
M Herrick ,
K Kimme ,
P Lancaster ,
M Riederer ,
C Santhaweeesuk ,
E Shullenberger  and
C Zhang
J Fournelle
Affiliation:
University of Wisconsin-Madison
K Bolger
Affiliation:
University of Wisconsin-Madison
J Cook
Affiliation:
University of Wisconsin-Madison
M Herrick
Affiliation:
University of Wisconsin-Madison
K Kimme
Affiliation:
University of Wisconsin-Madison
P Lancaster
Affiliation:
University of Wisconsin-Madison
M Riederer
Affiliation:
University of Wisconsin-Madison
C Santhaweeesuk
Affiliation:
University of Wisconsin-Madison
E Shullenberger
Affiliation:
University of Wisconsin-Madison
C Zhang
Affiliation:
University of Wisconsin-Madison

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 836 - 837
Copyright
© 2006 Microscopy Society of America