Hostname: page-component-788cddb947-jbjwg Total loading time: 0 Render date: 2024-10-15T05:03:38.012Z Has data issue: false hasContentIssue false
  • English
  • Français

A Simple Program for Fast Tilting Electron-Beam Sensitive Crystals to Zone Axes

Published online by Cambridge University Press:  30 July 2021

Yanhang Ma  and
Tu Sun
Yanhang Ma
Affiliation:
ShanghaiTech University, Shanghai, China (People's Republic)
Tu Sun
Affiliation:
ShanghaiTech University, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2994 - 2995
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Williams, D.B., Carter, C.B., Transmission Electron Microscopy: A Textbook For Materials Science, second ed., Springer, 2009.CrossRefGoogle Scholar
Wiktor, C., Meledina, M., Turner, S., Lebedev, O.I., Fischer, R.A., Treacy, M.M.J., Newsam, J.. Ultramicroscopy 23 (1987) 411–419.Google Scholar
Wiktor, C., Meledina, M., Turner, S., Lebedevd, O.I., Fischere, R.A.. J. Mater. Chem. A 5 (2017) 14969–14989.CrossRefGoogle Scholar
Terasaki, O., Thomas, J.M., Millward, G.R.. Proc. R. Soc. Lond. A 395 (1984) 153–164.Google Scholar
von Heimendahl, M., Bell, W., Thomas, G., J. Appl. Phys. 35 (1964) 3614–3616.CrossRefGoogle Scholar
Ecob, R.C., Shaw, M.P., Porter, A.J., Ralph, B.. Philos. Mag. A 44 (1981)1117–1133.CrossRefGoogle Scholar
Heilmann, P., Clark, W.A.T., Rigney, D.A.. Ultramicroscopy 9 (1982) 365–371.CrossRefGoogle Scholar
Liu, Q.. Ultramicroscopy 60 (1995) 81–89.CrossRefGoogle Scholar
Duden, T., Gautam, A., Dahmen, U.. Ultramicroscopy 111 (2011) 1574–1580.CrossRefGoogle Scholar
Zhang, D.L., Zhu, Y.H., Liu, L.M., Ying, X.R., Hsiung, C., Sougrat, R., Li, K., Han, Y.. Science 359 (2018) 675–679,CrossRefGoogle Scholar