Site-specific Lift Out Sample Preparation Technique for Atom Probe Analysis

D Lawrence; K Thompson; DJ Larson; B Gorman

doi:10.1017/S1431927606064099

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Crossref Citations

This article has been cited by the following publications. This list is generated based on data provided by Crossref.

Takahashi, Jun Kawakami, Kazuto Yamaguchi, Yukiko and Sugiyama, Masaaki 2007. Development of atom probe specimen preparation techniques for specific regions in steel materials. Ultramicroscopy, Vol. 107, Issue. 9, p. 744.

Takahashi, Jun Tarui, Toshimi and Kawakami, Kazuto 2009. Three-dimensional atom probe analysis of heavily drawn steel wires by probing perpendicular to the pearlitic lamellae. Ultramicroscopy, Vol. 109, Issue. 2, p. 193.

Gault, Baptiste Moody, Michael P. Cairney, Julie M. and Ringer, Simon P. 2012. Atom Probe Microscopy. Vol. 160, Issue. , p. 71.

Miller, Michael K. and Forbes, Richard G. 2014. Atom-Probe Tomography. p. 189.

Rosenkranz, Andreas Reinert, Leander Gachot, Carsten Aboufadl, Hisham Grandthyll, Samuel Jacobs, Karin Müller, Frank and Mücklich, Frank 2015. Oxide Formation, Morphology, and Nanohardness of Laser‐Patterned Steel Surfaces. Advanced Engineering Materials, Vol. 17, Issue. 8, p. 1234.

Laiginhas, F. A. Perez-Huerta, A. Martens, R. L. Prosa, T. J. and Reinhard, D. 2015. Atom Probe Tomography Analysis of Bulk Chemistry in Mineral Standards. Microscopy and Microanalysis, Vol. 21, Issue. S3, p. 843.

Aboulfadl, H. Deges, J. Choi, P. and Raabe, D. 2015. Dynamic strain aging studied at the atomic scale. Acta Materialia, Vol. 86, Issue. , p. 34.

Meisnar, Martina Moody, Michael and Lozano-Perez, Sergio 2015. Atom probe tomography of stress corrosion crack tips in SUS316 stainless steels. Corrosion Science, Vol. 98, Issue. , p. 661.

Takahashi, Jun Kawakami, Kazuto and Kobayashi, Yukiko 2019. Application of atom probe tomography to fundamental issues of steel materials. Surface and Interface Analysis, Vol. 51, Issue. 1, p. 12.

Wen, Pengyan Xiu, Huixin Zhang, Shuming Liu, Jianping Chen, Yimeng and Yang, Hui 2024. Atomic-level quantum well degradation of GaN-based laser diodes investigated by atom probe tomography. Journal of Applied Physics, Vol. 136, Issue. 4,

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Site-specific Lift Out Sample Preparation Technique for Atom Probe Analysis

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