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(S)TEM Analysis of the Strain and Morphology of InAs Quantum Dots using GaAs(Sb)(N) Capping Layers for Solar Cell Applications

Published online by Cambridge University Press:  14 March 2016

D. F. Reyes ,
A. D. Utrilla ,
T. Ben ,
J. J. Saborido ,
J. M. Ulloa ,
G. Bárcena-Gonzálz ,
M. P. Guerrero-Lebrero ,
E. Guerrero  and
D. Gonzalez
D. F. Reyes
Affiliation:
Departamento de Ciencia de los Materiales e IM y QI, Universidad de Cádiz, 11510 Puerto Real (Cádiz), Spain.
A. D. Utrilla
Affiliation:
Institute for Systems based on Optoelectronics and Microtechnology (ISOM), Universidad Politécnica de Madrid, Ciudad Universitaria s/n, 28040 Madrid, Spain.
T. Ben
Affiliation:
Departamento de Ciencia de los Materiales e IM y QI, Universidad de Cádiz, 11510 Puerto Real (Cádiz), Spain.
J. J. Saborido
Affiliation:
Departamento de Ciencia de los Materiales e IM y QI, Universidad de Cádiz, 11510 Puerto Real (Cádiz), Spain.
J. M. Ulloa
Affiliation:
Institute for Systems based on Optoelectronics and Microtechnology (ISOM), Universidad Politécnica de Madrid, Ciudad Universitaria s/n, 28040 Madrid, Spain.
G. Bárcena-Gonzálz
Affiliation:
Department of Computer Science and Engineering, University of Cádiz, Spain.
M. P. Guerrero-Lebrero
Affiliation:
Department of Computer Science and Engineering, University of Cádiz, Spain.
E. Guerrero
Affiliation:
Department of Computer Science and Engineering, University of Cádiz, Spain.
D. Gonzalez
Affiliation:
Departamento de Ciencia de los Materiales e IM y QI, Universidad de Cádiz, 11510 Puerto Real (Cádiz), Spain.

Abstract

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Type
Material Sciences
Information
Microscopy and Microanalysis , Volume 22 , Issue S4: 4th Joint Congress of the Portuguese and Spanish Microscopy Societies: mfs2015 - Microscopy at the Frontiers of Science , March 2016 , pp. 46 - 47
Copyright
Copyright © Microscopy Society of America 2016 

References

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[2]Shockley, W. & Queisser, H.J., J. Appl. Phys 32 (1961). p. 510.CrossRefGoogle Scholar
[3]Ulloa, JM., Reyes, DF., Montes, M., Yamamoto, K., Sales, DL., Gonzalez, D. & Guzman, A., Appl Phys Lett 100 (2012). p. 013107.Google Scholar
[4]Costantini, G., Rastelli, A, Manzano, C, Acosta-Diaz, P, Songmuang, R, Katsaros, G, Schmidt, O & Kern, K, Phys. Rev. Lett 96 (2006). p. 226106.CrossRefGoogle Scholar
[5] We acknowledge the Spanish MICINN-MINECO for funding through project MAT2013- 47102-C2, and SCCYT-UCA for technical support.Google Scholar