Hostname: page-component-5c6d5d7d68-vt8vv Total loading time: 0.001 Render date: 2024-08-07T01:02:33.995Z Has data issue: false hasContentIssue false
  • English
  • Français

STEM Axial Resolution Calculated by Monte Carlo Simulations in Micrometers-Thick Substrates

Published online by Cambridge University Press:  08 April 2017

H Demers ,
D Drouin  and
N de Jonge
H Demers
Affiliation:
Université de Sherbrooke, Canada
D Drouin
Affiliation:
Université de Sherbrooke, Canada
N de Jonge
Affiliation:
Vanderbilt University School of Medicine

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 952 - 953
Copyright
Copyright © Microscopy Society of America 2011