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(S)TEM Characterization of Chemically Exfoliated Black Phosphorus

Published online by Cambridge University Press:  25 July 2016

Amy Ng ,
Thomas E. Sutto ,
Yexin Deng ,
Rhonda M. Stroud ,
Todd H. Brintlinger ,
Peide D. Ye  and
Nabil D. Bassim
Amy Ng
Affiliation:
NRC Postdoctoral Associate, Naval Research Laboratory, Washington, DC, USA
Thomas E. Sutto
Affiliation:
Naval Research Laboratory, Materials Science & Technology Division, Washington, DC, USA
Yexin Deng
Affiliation:
Purdue University, School of Electrical and Computer Engineering, West Lafayette, IN, USA
Rhonda M. Stroud
Affiliation:
Naval Research Laboratory, Materials Science & Technology Division, Washington, DC, USA
Todd H. Brintlinger
Affiliation:
Naval Research Laboratory, Materials Science & Technology Division, Washington, DC, USA
Peide D. Ye
Affiliation:
Purdue University, School of Electrical and Computer Engineering, West Lafayette, IN, USA
Nabil D. Bassim
Affiliation:
Naval Research Laboratory, Materials Science & Technology Division, Washington, DC, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1544 - 1545
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Liu, H, et al, ACS Nano 8 (2014). p. 4033–4041.Google Scholar
[2] Xu, Y, Dai, J & Zeng, XC J Phys Chem Lett 6 (2015). p. 1996–2002.Google Scholar
[3] Zhao, W, et al, ACS Appl Mater Interfaces (2015).Google Scholar
[4] Hanlon, D, et al, Nat Comm (2015).Google Scholar
[5] The authors acknowledge funding from the Office of Naval Research (Naval Research Laboratory Basic Research Program).Google Scholar