Hostname: page-component-77c89778f8-vsgnj Total loading time: 0 Render date: 2024-07-17T10:19:29.254Z Has data issue: false hasContentIssue false
  • English
  • Français

STEM EBIC Thermometry Calibration with PEET on Al Nanoparticles

Published online by Cambridge University Press:  30 July 2020

William Hubbard ,
Matthew Mecklenburg  and
B. C. Regan
William Hubbard
Affiliation:
NanoElectroning Imaging, Inc. (NEI), Los Angeles, California, United States
Matthew Mecklenburg
Affiliation:
University of Southern California, Los Angeles, California, United States
B. C. Regan
Affiliation:
UCLA Department of Physics & Astronomy, Los Angeles, California, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 3124 - 3125
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Hubbard, WA et al. ., Physical Review Applied 10 (2018), p. 044066.10.1103/PhysRevApplied.10.044066CrossRefGoogle Scholar
Hubbard, WA et al. ., Applied Physics Letters 115 (2019), p. 133502.10.1063/1.5117055CrossRefGoogle Scholar
Mecklenburg, M et al. ., Ultramicroscopy 207 (2019), p. 112852.10.1016/j.ultramic.2019.112852CrossRefGoogle Scholar
Mecklenburg, M et al. ., Science 347 (2015), p. 629-632.10.1126/science.aaa2433CrossRefGoogle Scholar
Lagos, M et al. ., Nano Letters 18 (2018), p. 4556-4563.10.1021/acs.nanolett.8b01791CrossRefGoogle Scholar
Idrobo, J C et al. ., Physical Review Letters 120 (2018), p. 095901.10.1103/PhysRevLett.120.095901CrossRefGoogle Scholar
Wehmeyer, G et al. ., Applied Physics Letters 113 (2018), p. 253101.10.1063/1.5066111CrossRefGoogle Scholar
This material is based upon work supported by the Defense Microelectronic Activity under Contract No. HQ072720P0004, and by NSF STC award DMR-1548924 (STROBE), NSF award DMR-1611036, and the UCLA PSEIF.Google Scholar