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STEM EDS/EELS for Phase Analysis of Deep-Mantle Rock Assemblages Supported by Machine Learning
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Advances in Characterization of Geological and Extraterrestrial Samples
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- Copyright
- Copyright © Microscopy Society of America 2019
References
[1]Jia, S and Qian, YT, IEEE Transactions on Geoscience and Remote Sensing, 47 (2009), p. 161–173.Google Scholar