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STEM-in-SEM: A Re-Emerging Material Measurement Approach

Published online by Cambridge University Press:  30 July 2021

Robert Keller
Robert Keller*
Affiliation:
NIST, Boulder, Colorado, United States

Abstract

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Type
Advances in Analytical STEM-in-SEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1050 - 1051
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

Footnotes

*This work is a contribution of the U.S. Department of Commerce and is not subject to copyright in the United States.

References

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