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STEM-in-SEM Imaging and Diffraction with Extremely Beam Sensitive Ultrathin Zeolites

Published online by Cambridge University Press:  30 July 2021

Jason Holm
Jason Holm*
Affiliation:
NIST, Boulder, Colorado, United States

Abstract

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Type
Advances in Analytical STEM-in-SEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1584 - 1585
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Kumar, P., et al. Nature Materials 2020 (19) 449-449.Google Scholar
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Caplins, B. W., et al., Ultramicroscopy 2020 (291) 113137.Google Scholar
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