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Stereological Recovery of Five-Parameter Grain Boundary Character Distributions from EBSD Maps

Published online by Cambridge University Press:  01 August 2005

C-S Kim ,
J Gruber  and
G Rohrer
C-S Kim
Affiliation:
Carnegie Mellon University
J Gruber
Affiliation:
Carnegie Mellon University
G Rohrer
Affiliation:
Carnegie Mellon University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1660 - 1661
Copyright
© 2005 Microscopy Society of America