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Stereological Techniques for Quantitative Characterization of Microstructures

Published online by Cambridge University Press:  25 July 2016

Arun M. Gokhale
Arun M. Gokhale*
Affiliation:
Professor of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia30062, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1966 - 1967
Copyright
© Microscopy Society of America 2016 

References

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