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Study of Helium-Ion-Beam-Generated Defects in a Monolayer WS2 Using Aberration-Corrected Scanning Transmission Electron Microscopy
Published online by Cambridge University Press: 01 August 2018
Abstract
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- Information
- Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1596 - 1597
- Copyright
- © Microscopy Society of America 2018
References
References:
[6] The authors acknowledge funding from the Office of Naval Research (Naval Research Laboratory Basic Research Program). T. R. Kim and J. Fonseca Vega acknowledge National Research Council for the Research Associate Award.Google Scholar