Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-18T01:15:50.215Z Has data issue: false hasContentIssue false
  • English
  • Français

TEM Based High Resolution Electron Diffraction Techniques for Three-dimensional Nanostructure Determination

Published online by Cambridge University Press:  23 September 2015

Jian-Min Zuo ,
Yifei Meng ,
Piyush Vivek Deshpande ,
Yang Hu ,
Kyou-Hyun Kim ,
Hui Xing ,
Peng Zhang  and
Haifeng Wang
Jian-Min Zuo
Affiliation:
Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801 Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013
Yifei Meng
Affiliation:
Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801 Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013
Piyush Vivek Deshpande
Affiliation:
Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801 Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013
Yang Hu
Affiliation:
Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801 Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013
Kyou-Hyun Kim
Affiliation:
Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801 Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013
Hui Xing
Affiliation:
Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801 Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013 School of Materials Science and Engineering, Shanghai Jiaotong University, China
Peng Zhang
Affiliation:
Western Digital Technologies, Inc., 44200 Osgood Road, Fremont CA, 94539
Haifeng Wang
Affiliation:
Western Digital Technologies, Inc., 44200 Osgood Road, Fremont CA, 94539

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1095 - 1096
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Cowley, J.M. "Electron Diffraction Techniques." 1993: International Union of Crystallography..Google Scholar
[2] Spence, J.C.H. & Zuo, J.M., “Electron microdiffraction”. (1992) Plenum Press.Google Scholar
[3] Zuo, J.M., et al, Science (2003) 300(5624): p. 1419–1421.Google Scholar
[4] Zuo, J.M., et al., Microscopy Research and Technique (2004) 64(5-6): p. 347–355.Google Scholar
[5] Rauch, E.F., et al, Zeitschrift Fur Kristallographie (2010) 225(2-3): p. 103–109.CrossRefGoogle Scholar
[6] Alloyeau, D., et al, Ultramicroscopy (2008) 108(7): p. 656–662.Google Scholar
[7] Ganesh, K., et al, “Microscopy and Microanalysis” (2010). 16(SupplementS2) (p. 1728–1729.Google Scholar
[8] Liu, H.H., et al, Science (2011) 332(6031): p. 833–834.Google Scholar
[9] Tao, J., et al, Physical Review Letters (2009) 103(9.Google Scholar
[10] The work reported here is supported by DOE BES under contract DEFG02-01ER45923 and a grant from Western Digital..Google Scholar