No CrossRef data available.
Article contents
TEM Characterization of Ball Milled CIS and CIGS Nanoparticles
Published online by Cambridge University Press: 23 September 2015
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927615011204/resource/name/firstPage-S1431927615011204a.jpg)
- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2085 - 2086
- Copyright
- Copyright © Microscopy Society of America 2015
References
[1]
Calderon, H.A., Kisielowski, C., Specht, P., Barton, B., Godinez-Salomon, F. & Solorza-Feria, O., Micron
68 (2014). p. 164.CrossRefGoogle Scholar
[2] Electron Microscopy was performed at the Molecular Foundry, which is supported by the Office of Science, Office of Basic Energy Sciences of the U.S. Department of Energy under Contract No.DE-AC02-05CH11231. The research is partially supported by CONACYT (Proyecto FOINST. 75/2012, 148304 and 129207), IPN (COFAA, SIP).Google Scholar