Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-19T11:47:27.022Z Has data issue: false hasContentIssue false
  • English
  • Français

TEM Characterization of Epitaxial MnSi Films Grown on (111) Si Substrates

Published online by Cambridge University Press:  01 August 2010

MD Robertson ,
EA Karhu  and
TL Monchesky
MD Robertson
Affiliation:
Acadia University, Canada
EA Karhu
Affiliation:
Dalhousie University, Canada
TL Monchesky
Affiliation:
Dalhousie University, Canada

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1228 - 1229
Copyright
Copyright © Microscopy Society of America 2010