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TEM Characterization of InAs Quantum Dots with GaAsSb Spacer Layers
Published online by Cambridge University Press: 25 July 2016
Abstract
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- Information
- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1656 - 1657
- Copyright
- © Microscopy Society of America 2016
References
[6] The recent work at ASU was supported by the National Science Foundation and the Department of Energy under NSF CA No. EEC-1041895. The authors acknowledge the use of facilities within the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University.Google Scholar