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TEM Imaging and Electron Diffraction of Vertically Stacked Graphene/h-BN with Fine Control of Twist Angle
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
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- Copyright
- Copyright © Microscopy Society of America 2019
References
[4]The authors acknowledge funding from the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (NRF-2017R1A5A1014862) and the Institute for Basic Science (IBS-R026-D1).Google Scholar