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TFS: Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  27 August 2014

Tim Dahmen ,
Jean-Pierre Baudoin ,
Andrew R. Lupini ,
Christian Kübel ,
Philipp Slusallek  and
Niels de Jonge
Tim Dahmen
Affiliation:
German Research Center for Artificial Intelligence GmbH, Saarbrücken, Germany
Jean-Pierre Baudoin
Affiliation:
Department of Molecular Physiology and Biophysics, Vanderbilt University School of Medicine, Nashville, TN, USA
Andrew R. Lupini
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Christian Kübel
Affiliation:
KIT –Karlsruhe Institute for Technology, Eggenstein-Leopoldshafen, Germany
Philipp Slusallek
Affiliation:
German Research Center for Artificial Intelligence GmbH, Saarbrücken, Germany
Niels de Jonge
Affiliation:
Department of Molecular Physiology and Biophysics, Vanderbilt University School of Medicine, Nashville, TN, USA INM – Leibniz Institute for New Materials, Saarbrücken, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 786 - 787
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Kourkoutis, LP, et al, Ann Rev Mater Res 42 2012) p. 33.Google Scholar
[2] Lupini, AR & de Jonge, N N, Microsc Microanal 17 2011) p. 817.Google Scholar
[3] Dahmen, T, et al, Microsc Microanal 2014) doi:10.1017/S1431927614000075.Google Scholar
[4] We thank Marsallek, L & Pennycook, S.J for discussions, and E. Arzt for support through the.Google Scholar