Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-18T22:17:45.078Z Has data issue: false hasContentIssue false
  • English
  • Français

The Impact of Aberration-Corrected Transmission Electron Microscopy on Catalysis Investigations

Published online by Cambridge University Press:  01 August 2010

P Specht ,
R Gulotty Jr ,
D Barton ,
R Cieslinski ,
S Rozeveld ,
J Kang  and
C Kisielowski
P Specht
Affiliation:
University of California, Berkeley
R Gulotty Jr
Affiliation:
DOW Chemical Company
D Barton
Affiliation:
DOW Chemical Company
R Cieslinski
Affiliation:
DOW Chemical Company
S Rozeveld
Affiliation:
DOW Chemical Company
J Kang
Affiliation:
DOW Chemical Company
C Kisielowski
Affiliation:
Lawrence Berkeley National Laboratory

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 122 - 123
Copyright
Copyright © Microscopy Society of America 2010