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Thickness Analysis of TiO2Thin Films on Quartz by Optical Spectroscopy

Published online by Cambridge University Press:  25 July 2016

Simon Fowler ,
Ryan Catabay  and
Jun Jiao
Simon Fowler
Affiliation:
Department of Applied Physics at Portland State University (PSU), Portland OR, USA
Ryan Catabay
Affiliation:
Department of Mechanical and Materials Engineering at PSU, Portland OR, USA
Jun Jiao
Affiliation:
Department of Applied Physics at Portland State University (PSU), Portland OR, USA Department of Mechanical and Materials Engineering at PSU, Portland OR, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1636 - 1637
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Tada, H. & Tanaka, M. Langmuir 13 (1997). p. 360–364.CrossRefGoogle Scholar
[2] This study is supported in part from PSU’s Institute of Sustainable Solutions, Undergraduate Research Mentorship Program, and NSF-REU program.Google Scholar