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Three-dimensional Characterisation of Nanomaterials Using Aberration-Corrected STEM

Published online by Cambridge University Press:  31 July 2006

PD Nellist ,
EC Cosgriff ,
V Nicolosi  and
JN Coleman
PD Nellist
Affiliation:
Trinity College Dublin,Ireland
EC Cosgriff
Affiliation:
Trinity College Dublin,Ireland
V Nicolosi
Affiliation:
Trinity College Dublin,Ireland
JN Coleman
Affiliation:
Trinity College Dublin,Ireland

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1338 - 1339
Copyright
© 2006 Microscopy Society of America