No CrossRef data available.
Article contents
Three-dimensional Charge Density and Electric Field Mapping of an Electrically Biased Needle Using Off-axis Electron Holography
Published online by Cambridge University Press: 30 July 2020
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927620018450/resource/name/firstPage-S1431927620018450a.jpg)
- Type
- Direct Phase Imaging with Coherent Electron Beam in TEM
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Vurpillot, F., et al. , Ultramicroscopy. 159 (2015) 202.10.1016/j.ultramic.2014.12.013CrossRefGoogle Scholar
Lichte, H., et al. , Rep. Prog. Phys. 71 (2007) 016102.10.1088/0034-4885/71/1/016102CrossRefGoogle Scholar
The authors acknowledge the European Union for funding through the Marie Curie Initial Training Network Grant No. 606988 under FP7-PEOPLE-2013-ITN).Google Scholar