Hostname: page-component-848d4c4894-xm8r8 Total loading time: 0 Render date: 2024-07-02T01:14:35.606Z Has data issue: false hasContentIssue false
  • English
  • Français

Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry and DualBeam FIB/SEM Imaging of Lithium-ion Battery Cathode

Published online by Cambridge University Press:  05 August 2019

Chengge Jiao ,
Lex Pillatsch ,
Johannes Mulders  and
David Wall
Chengge Jiao*
Affiliation:
ThermoFisher Scientific, Eindhoven, the Netherlands.
Lex Pillatsch
Affiliation:
Empa (Swiss Federal Laboratories for Materials Science and Technology), Laboratory for Mechanics of Materials and Nanostructures, Thun, Switzerland. TOFWERK AG, Thun, Switzerland.
Johannes Mulders
Affiliation:
ThermoFisher Scientific, Eindhoven, the Netherlands.
David Wall
Affiliation:
ThermoFisher Scientific, Eindhoven, the Netherlands.
*
*Corresponding author: chengge.jiao@thermofisher.com

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 876 - 877
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ye, J et al. , Scientific Reports [Online] 5, 16190, (2015), https://www.nature.com.Google Scholar
[2]Hovington, P et al. , Scanning 38, (2016), p.571–578.Google Scholar
[3]Pillatsch, L, Ostlund, F, Michler, J, Progress in Crystal Growth and Characterization of Materials [Online] December 2018, https://doi.org/10.1016/j.pcrysgrow.2018.10.001.Google Scholar