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Article contents
Too Close for Comfort: Creating Two TEM Samples From Areas Separated By 270 Nanometers
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Advances in Focused Ion Beam Instrumentation and Techniques
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[2]Fujii, T et al. , in “Focused Ion Beam Systems”, ed. Yao, Nan, (Cambridge, New York) pp. 382-383.Google Scholar