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Towards Quantitative Analysis of STEM Image Contrast of Interfaces and Surfaces

Published online by Cambridge University Press:  01 August 2010

S Stemmer ,
JM LeBeau ,
SD Findlay ,
AJ D'Alfonso  and
LJ Allen
S Stemmer
Affiliation:
University of California, Santa Barbara
JM LeBeau
Affiliation:
University of California, Santa Barbara
SD Findlay
Affiliation:
The University of Tokyo, Japan
AJ D'Alfonso
Affiliation:
University of Melbourne, Australia
LJ Allen
Affiliation:
University of Melbourne, Australia

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1472 - 1473
Copyright
Copyright © Microscopy Society of America 2010