Hostname: page-component-77c89778f8-m8s7h Total loading time: 0 Render date: 2024-07-18T20:26:16.575Z Has data issue: false hasContentIssue false
  • English
  • Français

Transmission Electron Backscatter Diffraction (tEBSD) analysis of Au Thin Films

Published online by Cambridge University Press:  23 September 2015

Eliot Estrine ,
Nicholas Seaton ,
Prabesh Dulal  and
Bethanie Stadler
Eliot Estrine
Affiliation:
ECE Department, University of Minnesota, Minneapolis, MN
Nicholas Seaton
Affiliation:
Characterization Facility, University of Minnesota, Minneapolis, MN
Prabesh Dulal
Affiliation:
ECE Department, University of Minnesota, Minneapolis, MN
Bethanie Stadler
Affiliation:
ECE Department, University of Minnesota, Minneapolis, MN

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1671 - 1672
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Rausch, T., Chu, A. S., Lu, P., Puranam, S., Nagulapally, D. & Dykes, J. Recording Performance of a Pulsed HAMR Architecture 2014.Google Scholar
[2] Link, S., Wang, Z. L. & El-Sayed, M. A., The Journal of Physical Chemistry B 104, 33 (2000).Google Scholar
[3] Brandon, D., Acta Metallurgica 14, 11 (1966).CrossRefGoogle Scholar
[4] Keller, R. & Geiss, R., J. Microsc 245, 3 (2012).CrossRefGoogle Scholar