Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-10T18:18:26.176Z Has data issue: false hasContentIssue false
  • English
  • Français

Transmission-EBSD Using High Current Electron Beams

Published online by Cambridge University Press:  25 July 2016

Majid Abbasi ,
Dong-Ik Kim ,
Hwan-Uk Guim  and
Woo-Sang Jung
Majid Abbasi*
Affiliation:
High Temperature Energy Materials Research Center, Korea Institute of Science and Technology (KIST), Seoul 136-791, Republic of Korea
Dong-Ik Kim
Affiliation:
High Temperature Energy Materials Research Center, Korea Institute of Science and Technology (KIST), Seoul 136-791, Republic of Korea
Hwan-Uk Guim
Affiliation:
Nano-Bio Electron Microscopy Research Team, Korea Basic Science Institute (KBSI), Daejeon 305-333, Republic of Korea
Woo-Sang Jung
Affiliation:
High Temperature Energy Materials Research Center, Korea Institute of Science and Technology (KIST), Seoul 136-791, Republic of Korea
*
*majid.abbasi@kist.re.kr, Phone: (+82) 10-8946-8873 Fax: (+82) 2-958-5449

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1652 - 1653
Copyright
© Microscopy Society of America 2016 

References

[1] Geiss, R.H., Keller, R.R. & Read, D.T. Microsc. Microanal 16 (2010). pp. 1742–1743.CrossRefGoogle Scholar
[2] Brodusch, N., Demers, H., Trudeau, M., etal, Scanning 35 (2013). pp. 375–386.Google Scholar
[3] Geiss, R.H. Microsc. Microanal 21 (2015). pp. 1249–1250.Google Scholar
[4] Trimby, P.W. Ultramicroscopy 120 (2012). pp. 16–24.CrossRefGoogle Scholar
[5] Fundenberger, J.J., Bouzy, E., Goran, D., et al, Ultramicroscopy, In-press. DOI: 10.1016/j.ultramic.2015.11.002.Google Scholar
[6] Abbasi, M., Kim, D.I., Guim, H.U., et al, ACS Nano 9 (2015). pp. 10991–11002.Google Scholar
[7] Goran, D., et al, Royal Microscopy Society Proceedings (2015) Glasgow, UK.Google Scholar
[8] Wang, Z.L. Micron 34 (2003) 141–155.Google Scholar
[9] Bremen, R.V., Gomes, D.R., Jeer, L.T.H.D., et al, Ultramicroscopy 160 (2016). pp. 256–264.CrossRefGoogle Scholar
[10] Hong, S.H., Phaniraj, M.P., Kim, D.I., et al, Electrochem. Solid State Lett 13 (2010). pp. 40–42.CrossRefGoogle Scholar
[11] The authors gratefully acknowledge the financial support by KIST (2E25322) and the New & Renewable Energy R&D program (20113020030020), Ministry of Knowledge Economy, Rep. of Korea.Google Scholar