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Treading Lightly - Achieving Spectroscopy and Elemental Maps of Beam Sensitive Specimens in the SEM

Published online by Cambridge University Press:  04 August 2017

J. T. Sagar ,
J. Holland  and
S. R. Burgess
J. T. Sagar
Affiliation:
Oxford Instruments Nanoanalysis, Halifax Road, High Wycombe, UK
J. Holland
Affiliation:
Oxford Instruments Nanoanalysis, Halifax Road, High Wycombe, UK
S. R. Burgess
Affiliation:
Oxford Instruments Nanoanalysis, Halifax Road, High Wycombe, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1840 - 1841
Copyright
© Microscopy Society of America 2017 

References

[1] Egerton, R. F., Li, P. & Malac, M. Micron 35(6 2004). p. 399.CrossRefGoogle Scholar
[2] Hovington, P., et al, Scanning 38 2016). p. 571.Google Scholar
[3] Bearden, J. A. Rev. Mod. Phys 29 1967). p. 78.Google Scholar