Hostname: page-component-848d4c4894-89wxm Total loading time: 0 Render date: 2024-07-06T07:31:22.062Z Has data issue: false hasContentIssue false
  • English
  • Français

Two Methods for Measuring Lamellae Thicknesses In situ for Improved FIB Specimen Preparation

Published online by Cambridge University Press:  05 August 2019

Alexander Rakowski ,
Evan Tillotson ,
Aidan Rooney  and
Sarah Haigh
Alexander Rakowski
Affiliation:
Department of Chemistry, University of California Irvine, Irvine, CA, USA. School of Materials, University of Manchester, Manchester, UK.
Evan Tillotson
Affiliation:
School of Materials, University of Manchester, Manchester, UK.
Aidan Rooney*
Affiliation:
CEA Leti, Grenoble, France.
Sarah Haigh*
Affiliation:
School of Materials, University of Manchester, Manchester, UK.
*
*Corresponding authors: Aidan.Rooney@cea.fr and Sarah.Haigh@manchester.ac.uk
*Corresponding authors: Aidan.Rooney@cea.fr and Sarah.Haigh@manchester.ac.uk

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 858 - 859
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Pennycook, SJ, Ultramicroscopy 180 (2017), p. 22.Google Scholar
[2]de Jonge, N and Ross, FM, Nature nanotechnology 6 (2011), p. 695.Google Scholar
[3]Hu, S et al. , Nature nanotechnology 13 (2018), p. 468.Google Scholar
[4]Krivanek, OL et al. , Microscopy 62 (2013), p. 3.Google Scholar
[5]van Mierlo, W et al. , Ultramicroscopy 147 (2014), p. 149.Google Scholar
[6]Salzer, R et al. , Microscopy and Microanalysis 15 (2009), p. 340.Google Scholar
[7]Hiscock, M et al. , Microscopy and Microanalysis 20 (2014), p. 342.Google Scholar
[8]Hovington, P, Drouin, D and Gauvin, R, Scanning 19 (1997), p. 1.Google Scholar