Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
O'Leary, Colum
Liberti, Emanuela
Martinez, Gerardo
Allen, Christopher
Huang, Chen
Rothmann, Mathias
Luo, Hui
Kim, Judy
Herz, Laura
Assender, Hazel
Jones, Lewys
Kirkland, Angus
and
Nellist, Peter
2020.
Focused-probe STEM Ptychography: Developments and Opportunities.
Microscopy and Microanalysis,
Vol. 26,
Issue. S2,
p.
470.
Nord, Magnus
Webster, Robert W. H.
Paton, Kirsty A.
McVitie, Stephen
McGrouther, Damien
MacLaren, Ian
and
Paterson, Gary W.
2020.
Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing, and Storage.
Microscopy and Microanalysis,
Vol. 26,
Issue. 4,
p.
653.
MacLaren, Ian
Macgregor, Thomas A.
Allen, Christopher S.
and
Kirkland, Angus I.
2020.
Detectors—The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization.
APL Materials,
Vol. 8,
Issue. 11,
Dwyer, Christian
2021.
Quantitative annular dark-field imaging in the scanning transmission electron microscope—a review.
Journal of Physics: Materials,
Vol. 4,
Issue. 4,
p.
042006.